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Published in: Graefe's Archive for Clinical and Experimental Ophthalmology 4/2017

01-04-2017 | Book Review

Microperimetry and multimodal retinal imaging, Edoardo Midena (ed). Part of the series "Essentials in Ophthalmology", Series editor Singh AD. (2014) ISBN 978-3642-4029-99 Springer

Author: Shimon Rumelt

Published in: Graefe's Archive for Clinical and Experimental Ophthalmology | Issue 4/2017

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Excerpt

This book addresses a new concept in ophthalmology—microperimetry. This technique involves the integration of macular clinical images (including fundus color photographs, scanning laser ophthalmoscopy [SLO], and optical coherence tomography [OCT]) with automated perimetry (absolute threshold at different points of the visual field), and may be applicable in all macular and peripapillary disorders. Practically, it allows better correlation between anatomy and function, as the projection and reflection beams are identical in location. It is performed with the use of new devices for this purpose (MP-1 by Nidek in Japan, and Macular Integrity Assessment by CenterVue in Italy). In addition, the book addresses multimodal retinal imaging techniques such as optical coherence tomography, short-wavelength fundus autofluorescence, and different modes of scanning laser ophthalmoscopy. The book, as the author indicates, may serve as an atlas and diagnosis reference text for macular disorders, and may provide a reference source for both retinal experts and researches. The book was largely written by leading experts in the field from Europe and the US, under the editorial skills of Prof. Midena, a leading figure in the study of the retina. …
Metadata
Title
Microperimetry and multimodal retinal imaging, Edoardo Midena (ed). Part of the series "Essentials in Ophthalmology", Series editor Singh AD. (2014) ISBN 978-3642-4029-99 Springer
Author
Shimon Rumelt
Publication date
01-04-2017
Publisher
Springer Berlin Heidelberg
Published in
Graefe's Archive for Clinical and Experimental Ophthalmology / Issue 4/2017
Print ISSN: 0721-832X
Electronic ISSN: 1435-702X
DOI
https://doi.org/10.1007/s00417-015-3063-6

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