Published in:

01-07-2002 | Technical Notes

SPECT imaging with off-set detector system: Comparison of sampling angles 2, 4 and 6 degrees

Authors: Yasuyuki Takahashi, Kenya Murase, Hiroshi Higashino, Hideo Kawakami, Isao Kawamata

Published in: Annals of Nuclear Medicine | Issue 5/2002