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Title
Interest of the ordered subsets expectation maximization (OS-EM) algorithm in pinhole single-photon emission tomography reconstruction: a phantom study
Authors
Christian Vanhove
Michel Defrise
Philippe R. Franken
Hendrik Everaert
Frank Deconinck
Axel Bossuyt
Publication date
01-02-2000
Publisher
Springer-Verlag
Published in
European Journal of Nuclear Medicine and Molecular Imaging / Issue 2/2000
Print ISSN: 1619-7070
Electronic ISSN: 1619-7089
DOI
https://doi.org/10.1007/s002590050019

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