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Scan Statistic and Multiple Scan Statistic

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Scan Statistics and Applications

Part of the book series: Statistics for Industry and Technology ((SIT))

Abstract

The scan statistic and multiple scan statistic can be used in many areas of science. In this chapter, a survey of results on scan statistic for the continuous conditional case is presented. We discuss the exact distribution and asymptotic results, and study various approximations and bounds. Moreover, a general expression for the kth moment of the multiple scan statistic and a computational approach for its distribution are covered. Numerical results comparing various approximations in the literature are also presented.

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Author information

Authors and Affiliations

  1. Tamkang University, Taiwan

    Chien-Tai Lin

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  1. Chien-Tai Lin
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Editors and Affiliations

  1. Department of Statistics, University of Connecticut at Storrs, Storrs, CT, 06269-3120, USA

    Joseph Glaz

  2. Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, L8S 4K1, Canada

    N. Balakrishnan

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© 1999 Springer Science+Business Media New York

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Lin, CT. (1999). Scan Statistic and Multiple Scan Statistic. In: Glaz, J., Balakrishnan, N. (eds) Scan Statistics and Applications. Statistics for Industry and Technology. Birkhäuser, Boston, MA. https://doi.org/10.1007/978-1-4612-1578-3_9

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  • DOI: https://doi.org/10.1007/978-1-4612-1578-3_9

  • Publisher Name: Birkhäuser, Boston, MA

  • Print ISBN: 978-1-4612-7201-4

  • Online ISBN: 978-1-4612-1578-3

  • eBook Packages: Springer Book Archive

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